BRAND : NANOMETRICS MODEL : 210XP DESCRIPTION : Film Types: Oxide on Silicon; Nitride on Silicon; Negative, Resist on Silicon; Polysilicon on Oxide; Negative Resist on  Oxide; Nitride on Oxide; Polyimide on Silicon; Positive Resist  on Silicon; Positive Resist on Oxide.Typical Measurement Time: 2.5 seconds. Weight : 5 kg SPECIFICATION : CATEGORY : MASK & WAFER INSPECTION 5x & 10x Objective Lenses 480nm - 720nm Measurable Thickness range 100 A - 80 um Wafer Size Range: 75 mm - 150 mm CONDITION : USED *TESTED , GOOD RUNNING CONDITION ( PRICE AS PER FOB PRICE ) ( PRICE IS NEGOTIABLE )